Estimation of alpha exposure on CR-39 detector using a UV-VIS spectrophotometer

This work is dedicated to study the possibility of using UV-VIS spectrophotometer, a non-invasive technique with a versatile applications that is being used to determine the optical properties of matter, to estimate the CR-39 exposure to alpha particles. CR-39 detectors were exposed to alpha particles from two different alpha sources: 241Am and radon gas. Tracks densities on CR-39 were determined using the traditional counting method by an optical microscope. The transmittances of CR-39 detectors were measured using UV-VIS spectroscopy in the range of 400-1000 nm, and results were correlated with measured tracks densities. The comparison showed that this method is effective in estimating exposure of CR-39 to alpha particles, and that its efficiency has increased by increasing the etching time of the detectors.