Automatic crack tip localization in enormous DIC images to in-situ characterize high-temperature fatigue crack growth behavior

被引:21
作者
Zhang, Chen [1 ,2 ]
Lei, Mengqi [1 ]
Chen, Yuanxin [1 ]
Kuang, Bin [3 ]
Liu, Shijie [3 ]
Ding, Yanhuai [3 ]
Fang, Qihong [1 ]
Li, Xiaotian [2 ]
He, Wei [1 ]
Xie, Huimin [4 ]
机构
[1] Hunan Univ, Coll Mech & Vehicle Engn, Changsha, Peoples R China
[2] Tsinghua Univ, Inst Nucl & New Energy Technol, Beijing, Peoples R China
[3] Xiangtan Univ, Sch Mech Engn & Mech, Xiangtan, Peoples R China
[4] Tsinghua Univ, Sch Aerosp Engn, AML, Beijing, Peoples R China
关键词
Extensive image datasets; Automation; Crack tip displacement field; Immune algorithm; Stress intensity factor; FRACTURE-MECHANICS; FIELDS; LENS;
D O I
10.1016/j.ijfatigue.2024.108364
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Digital Image Correlation (DIC), with its advantages of full -field, non -contact and applicability to extreme environments, is a powerful deformation measurement technique to in -situ monitor the high -temperature fatigue crack propagation behavior. For the DIC-based fracture mechanics analyses of cracking, crack tip position in DIC images, which is usually determined visually and manually, plays a significant role. However, the long-term fatigue-DIC experiment at both room -and high -temperatures poses a real challenge due to the huge amount of DIC images, lower image quality at high -temperature, and even the invisibility of cracks. In this paper, a fully automated algorithm for localizing the crack tip is proposed based on the crack tip displacement field and the immune algorithm. Compared to traditional algorithms, it does not necessitate iterative initial values of crack tip location, and permits precise and fast determination of critical fracture mechanics parameters, such as the Stress Intensity Factors (SIFs). The algorithm reliability is validated by both numerical simulation and fatigue testing of nickel -based superalloy GH4169 at room temperature and 650 degree celsius. It is shown that crack tip position and SIF values can be precisely and automatically determined within 7 s per image using an ordinary low-cost computer, which significantly improves the analyzing efficiency.
引用
收藏
页数:13
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