Bayesian estimation to identify crystalline phase structures for X-ray diffraction pattern analysis

被引:1
作者
Murakami, Ryo [1 ]
Matsushita, Yoshitaka [1 ]
Nagata, Kenji [1 ]
Shouno, Hayaru [2 ]
Yoshikawa, Hideki [1 ]
机构
[1] Natl Inst Mat Sci, Res Network & Facil Serv Div, Tsukuba 3050044, Japan
[2] Univ Electrocommun, Grad Sch Informat & Engn, Chofu, Japan
来源
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS-METHODS | 2024年 / 4卷 / 01期
关键词
X-ray diffraction; Bayesian inference; model selection; automatic spectral analysis; replica exchange Monte Carlo method; PEAK DETERMINATION; TITANIUM-DIOXIDE; POWDER;
D O I
10.1080/27660400.2023.2300698
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Crystalline phase structure is essential for understanding the performance and properties of a material. Therefore, this study identified and quantified the crystalline phase structure of a sample based on the diffraction pattern observed when the crystalline sample was irradiated with electromagnetic waves such as X-rays. Conventional analysis necessitates experienced and knowledgeable researchers to shorten the list from many candidate crystalline phase structures. However, the Conventional diffraction pattern analysis is highly analyst-dependent and not objective. Additionally, there is no established method for discussing the confidence intervals of the analysis results. Thus, this study aimed to establish a method for automatically inferring crystalline phase structures from diffraction patterns using Bayesian inference. Our method successfully identified true crystalline phase structures with a high probability from 50 candidate crystalline phase structures. Further, the mixing ratios of selected crystalline phase structures were estimated with a high degree of accuracy. This study provided reasonable results for well-crystallized samples that clearly identified the crystalline phase structures.<br /> [GRAPHICS]
引用
收藏
页数:20
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