SiC CMOS Gate Driver for High-Temperature Aerospace Applications

被引:0
|
作者
Torres, Felipe [1 ]
Martinez, Andres [1 ]
Marin, Jorge [1 ,2 ]
Rojas, Christian A. [1 ,2 ]
Gak, Joel [3 ]
Rommel, Mathias
Wilson-Veas, Alan H. [1 ,2 ]
May, Alexander [4 ]
Schraml, Michael [4 ]
Calarco, Nicolas [3 ]
Miguez, Matias [3 ]
机构
[1] Univ Tecn Federico Santa Maria, Dept Elect Eng, Valparaiso, Chile
[2] Univ Tecn Federico Santa Maria, Adv Ctr Elect & Elect Engn, Valparaiso, Chile
[3] Univ Catolica Uruguay, Engn Dept, Montevideo, Uruguay
[4] Fraunhofer Inst Integrated Syst & Device Technol, Erlangen, Germany
来源
2024 ARGENTINE CONFERENCE ON ELECTRONICS, CAE | 2024年
关键词
CMOS analogue integrated circuits; gate drivers; high temperature; silicon carbide; satellite power systems;
D O I
10.1109/CAE59785.2024.10487149
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, the exploration of Fraunhofer IISB's 2 mu m 4H-silicon carbide (SiC) complementary metal-oxide-semiconductor (CMOS) technology is presented, with a focus on its application in a gate driver for operating power transistors in power converters. The paper concentrates on the thermal characteristics of the gate driver under various temperatures, a vital aspect for satellite power systems. Simulation results detail the gate driver's turn-on and turn-off timings, along with propagation delays at different temperatures. Specifically, at 295 degrees C and 1 pF capacitive load, the maximum turn-on and turn-off times were found to be 29 ns and 15 ns respectively, while the maximum propagation delays for turn-on and turn-off were 89 ns and 145 ns. These findings are essential for assessing the gate driver's effectiveness and reliability in space environments. This research underline the efficacy of SiC technology for space applications, offering superior thermal management and radiation resistance.
引用
收藏
页码:99 / 102
页数:4
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