Improving the reliability of deep learning computational ghost imaging with prediction uncertainty based on neighborhood feature maps

被引:1
作者
Kataoka, Shoma [1 ]
Mizutani, Yasuhiro [1 ]
Uenohara, Tsutomu [1 ]
Ipus, Erick [2 ]
Nitta, Koichi [3 ]
Matoba, Osamu [3 ,4 ]
Takaya, Yasuhiro [1 ]
Tajahuerce, Enrique [2 ]
机构
[1] Osaka Univ, Grad Sch Engn, 2-1 Yamada Oka, Suita, Osaka, Japan
[2] Univ Jaume 1, Inst New Imaging Technol INIT, GROC UJI, Avda Sos Baynat S-N, Castellon de La Plana 12071, Spain
[3] Kobe Univ, Grad Sch Syst Informat, Rokkodai 1-1, Nada, Kobe 6578501, Japan
[4] Kobe Univ, Ctr Opt Scattering Image Sci, Rokkodai 1-1, Nada, Kobe 6578501, Japan
基金
日本学术振兴会;
关键词
SURFACE-DEFECTS; INSPECTION; SYSTEM;
D O I
10.1364/AO.511817
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Defect inspection is required in various fields, and many researchers have attempted deep -learning algorithms for inspections. Deep -learning algorithms have advantages in terms of accuracy and measurement time; however, the reliability of deep -learning outputs is problematic in precision measurements. This study demonstrates that iterative estimation using neighboring feature maps can evaluate the uncertainty of the outputs and shows that unconfident error predictions have higher uncertainties. In ghost imaging using deep learning, the experimental results show that removing outputs with higher uncertainties improves the accuracy by approximately 15.7%. (c) 2024 Optica Publishing Group
引用
收藏
页码:3736 / 3744
页数:9
相关论文
共 36 条
[1]  
Ayhan M.S., 2022, Medical Imaging with Deep Learning
[2]  
Belinskii A. V., 1994, Journal of Experimental and Theoretical Physics, V78, P259
[3]   Vision system with high dynamic range for optical surface defect inspection [J].
Cao, Zhaolou ;
Cui, Fenping ;
Zhai, Chunjie .
APPLIED OPTICS, 2018, 57 (34) :9981-9987
[4]   Surface defects and accompanying imperfections in 4H-SiC: Optical, structural and electrical characterization [J].
Chen, Bin ;
Matsuhata, Hirofumi ;
Sekiguchi, Takashi ;
Ichinoseki, Kyouichi ;
Okumura, Hajime .
ACTA MATERIALIA, 2012, 60 (01) :51-58
[5]   Ultrafast web inspection with hybrid dispersion laser scanner [J].
Chen, Hongwei ;
Wang, Chao ;
Yazaki, Akio ;
Kim, Chanju ;
Goda, Keisuke ;
Jalali, Bahram .
APPLIED OPTICS, 2013, 52 (17) :4072-4076
[6]   A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction [J].
Chen, Xue ;
Li, Jiaqi ;
Sui, Yongxin .
SENSORS, 2020, 20 (02)
[7]   Inspection and Classification of Semiconductor Wafer Surface Defects Using CNN Deep Learning Networks [J].
Chien, Jong-Chih ;
Wu, Ming-Tao ;
Lee, Jiann-Der .
APPLIED SCIENCES-BASEL, 2020, 10 (15)
[8]   HADAMARD-TRANSFORM IMAGE SCANNING [J].
DECKER, JA .
APPLIED OPTICS, 1970, 9 (06) :1392-+
[9]   Line-scanning laser scattering system for fast defect inspection of a large aperture surface [J].
Dong, Jingtao .
APPLIED OPTICS, 2017, 56 (25) :7089-7098
[10]   Compressed sensing [J].
Donoho, DL .
IEEE TRANSACTIONS ON INFORMATION THEORY, 2006, 52 (04) :1289-1306