Amodal Instance Segmentation of Thin Objects with Large Overlaps by Seed-to-Mask Extending

被引:0
作者
Kanke, Ryohei [1 ]
Takahashi, Masanobu [2 ]
机构
[1] Shibaura Inst Technol, Grad Sch Syst Engn & Sci, Saitama Shi 3378570, Japan
[2] Shibaura Inst Technol, Coll Syst Engn & Sci, Saitama Shi 3378570, Japan
关键词
amodal instance segmentation; deep learning; thin object; seed;
D O I
10.1587/transinf.2023EDL8068
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Amodal Instance Segmentation (AIS) aims to segment the regions of both visible and invisible parts of overlapping objects. The mainstream Mask R-CNN-based methods are unsuitable for thin objects with large overlaps because of their object proposal features with bounding boxes for three reasons. First, capturing the entire shapes of overlapping thin objects is difficult. Second, the bounding boxes of close objects are almost identical. Third, a bounding box contains many objects in most cases. In this paper, we propose a box-free AIS method, Seed-to-Mask, for thin objects with large overlaps. The method specifies a target object using a seed and iteratively extends the segmented region. We have achieved better performance in experiments on artificial data consisting only of thin objects.
引用
收藏
页码:908 / 911
页数:4
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