Investigating the physical and electrical properties of La2O3 via annealing of La(OH)3

A simple technique was utilized to fabricate pure hexagonal La2O3 nanorods by utilizing lanthanum(III) nitrate hexahydrate (La(NO3)(3)center dot 6H(2)O) and ammonia (NH4OH). The La2O3 nanoparticles were analyzed using XRD, TGA, Raman, SEM, FTIR, TEM, PL spectroscopy, and Mott-Schottky techniques. The XRD analysis confirmed the production of La(OH)(3) nanorods under appropriate conditions, which were then successfully converted into La2O2CO3 and finally into La2O3 nanorods through annealing. The TGA analysis showed that the total weight loss was due to water evaporation and the dissolution of minimal moisture present in the environment. The FTIR analysis confirmed the presence of functional groups. The SEM analysis revealed changes in morphology. The TEM analysis to determine the particle size. The PL findings showed three emission peaks at 390, 520, and 698 nm due to interband transitions and defects in the samples. The Mott-Schottky analysis demonstrated that the flatband potential and acceptor density varied with annealing temperature, ranging from 1 to 1.2 V and 2x10(18) to 1.4x10(19) cm(-3), respectively. Annealing at 1000 degrees C resulted in the lowest resistance to charge transfer (Rct).