TOF-SIMS analysis: Application to ultra-thin AWA film on magnetic head

被引：0
作者：
JIANG Zhicheng
LIU Yiwei WahFuk Chung
ChiYue Cheung
Ichiro Yagi
TIAN Hong Surface Analysis Laboratory SAE Magnetics H K Ltd SAE Tower Kwai Fung Crescent Kwai Chung N T Hong Kong China Visiting professor from Lanzhou Institute of Chemical Physics Chinese Academy of Sciences [38 ,42 ]
机构：
来源：
ScienceinChina,SerA. | 2001年 / Ser.A.2001(S1)卷 / S1期
关键词：
D O I：
暂无
中图分类号：
TP333 [存贮器];
学科分类号：
摘要：
<正> F-containing polymer was coated on the magnetic head of hard disc drive (HDD) as theultra-thin (<20(?)) film of anti-wetting agent (AWA). A static TOF-SIMS method has been applied tomeasuring the thickness and coating uniformity of the ultra-thin film. TOF- SIMS is also used tostudy the micro-tribology and transfer of lubricant between the magnetic head and media interface.
引用
收藏
页码：393 / 399
页数：7
相关论文
共 50 条
  • [31] Mapping hard magnetic recording disks by TOF-SIMS
    Spool, A.
    Forrest, J.
    APPLIED SURFACE SCIENCE, 2008, 255 (04) : 1482 - 1485
  • [32] ANALYSIS OF LIGNIN STRUCTURE USING TOF-SIMS
    Matsushita, Yasuyuki
    Ioka, Kousuke
    Saito, Kaori
    Takama, Ruka
    Aoki, Dan
    Fukushima, Kazuhiko
    PROCEEDING OF THE 4TH INTERNATIONAL CONFERENCE ON PULPING, PAPERMAKING AND BIOTECHNOLOGY (ICPPB '12), VOLS. I AND II, 2012, : 100 - 102
  • [33] Progress in cellular analysis using ToF-SIMS
    Lockyer, NP
    Vickerman, JC
    APPLIED SURFACE SCIENCE, 2004, 231 : 377 - 384
  • [34] Chemical analysis of lubricated surfaces with TOF-SIMS
    Nanao, Hidetaka, 1600, Japanese Society of Tribologists (59):
  • [35] High resolution surface analysis by TOF-SIMS
    Hagenhoff, B
    MIKROCHIMICA ACTA, 2000, 132 (2-4) : 259 - 271
  • [36] Imaging TOF-SIMS analysis of oligonucleotide microarrays
    Cheran, LE
    Vukovich, D
    Thompson, M
    ANALYST, 2003, 128 (02) : 126 - 129
  • [37] Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
    Bennet, Francesca
    Mueller, Anja
    Radnik, Joerg
    Hachenberger, Yves
    Jungnickel, Harald
    Laux, Peter
    Luch, Andreas
    Tentschert, Jutta
    JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2020, (163): : 1 - 26
  • [38] TOF-SIMS for carbon hybridization state analysis
    Drozdov, M. N.
    Ieshkin, A. E.
    Streletskiy, O. A.
    Nishchak, O. Yu
    Belykh, S. F.
    Tolstoguzov, A.
    CARBON, 2022, 186 : 83 - 90
  • [39] ToF-SIMS analysis of organic impurities in UPW
    Kobayashi, J
    Owari, M
    SURFACE AND INTERFACE ANALYSIS, 2006, 38 (04) : 305 - 308
  • [40] TOF-SIMS analysis of corroding museum glass
    Fearn, S.
    McPhail, D. S.
    Hagenhoff, B.
    Tallarek, E.
    APPLIED SURFACE SCIENCE, 2006, 252 (19) : 7136 - 7139
12345