Development of atomic force microscopy for atomic-scale measurements at solid-liuqid interfaces

被引：0
|
作者：
Fukuma T.
机构：
来源：
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering | 2019年 / 85卷 / 03期
关键词：
D O I：
10.2493/jjspe.85.247
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：247 / 250
页数：3
相关论文
共 50 条
  • [1] Atomic-Scale Structural Analysis on the Interfaces between Molten Gallium and Solid Alloys by Atomic Force Microscopy
    Ichii, Takashi
    Murata, Makoto
    Utsunomiya, Toru
    Sugimura, Hiroyuki
    JOURNAL OF PHYSICAL CHEMISTRY C, 2021, 125 (47): : 26201 - 26207
  • [2] ATOMIC-SCALE CONTRAST MECHANISM IN ATOMIC FORCE MICROSCOPY
    HEINZELMANN, H
    MEYER, E
    BRODBECK, D
    OVERNEY, G
    GUNTHERODT, HJ
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1992, 88 (03): : 321 - 326
  • [3] ATOMIC-SCALE RESOLUTION IN ATOMIC-FORCE MICROSCOPY
    LIN, F
    MEIER, DJ
    LANGMUIR, 1994, 10 (06) : 1660 - 1662
  • [4] Atomic-scale roughness effect on capillary force in atomic force microscopy
    Jang, JY
    Ratner, MA
    Schatz, GC
    JOURNAL OF PHYSICAL CHEMISTRY B, 2006, 110 (02): : 659 - 662
  • [5] THE ATOMIC-SCALE HYSTERESIS IN NON CONTACT ATOMIC FORCE MICROSCOPY
    Pishkenari, Hossein Nejat
    Meghdari, Ali
    PROCEEDINGS OF THE ASME 10TH BIENNIAL CONFERENCE ON ENGINEERING SYSTEMS DESIGN AND ANALYSIS, 2010, VOL 5, 2010, : 623 - 631
  • [6] Theoretical simulation of atomic-scale friction in atomic force microscopy
    Sasaki, N
    Kobayashi, K
    Tsukada, M
    SURFACE SCIENCE, 1996, 357 (1-3) : 92 - 95
  • [7] The imaging mechanism of atomic-scale Kelvin probe force microscopy and its application to atomic-scale force mapping
    Okamoto, K
    Sugawara, Y
    Morita, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (11): : 7163 - 7168
  • [8] Atomic-scale friction image of graphite in atomic-force microscopy
    Sasaki, N
    Kobayashi, K
    Tsukada, M
    PHYSICAL REVIEW B, 1996, 54 (03): : 2138 - 2149
  • [9] Advances in atomic-scale tribological mechanisms of solid interfaces
    Nian, Jingyan
    Si, Yifan
    Guo, Zhiguang
    TRIBOLOGY INTERNATIONAL, 2016, 94 : 1 - 13
  • [10] Analysis of Simulated Scanning of Atomic-Scale Silicon Surface by Atomic Force Microscopy
    Lin, Zone-Ching
    Liu, Shih-Che
    SCANNING, 2008, 30 (05) : 392 - 404
12345