Origin of functionality for functional materials at atomic scale

被引:15
|
作者
Xiao, Dongdong [1 ]
Gu, Lin [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100190, Peoples R China
[2] Univ Chinese Acad Sci, Sch Phys Sci, Beijing 100049, Peoples R China
[3] Songshan Lake Mat Lab, Dongguan 523808, Guangdong, Peoples R China
来源
NANO SELECT | 2020年 / 1卷 / 02期
基金
国家重点研发计划;
关键词
functional materials; functionalities; symmetry; transmission electron microscopy; MAGNETIC CIRCULAR-DICHROISM; HIGH THERMAL-CONDUCTIVITY; ENERGY-LOSS SPECTROSCOPY; PHASE-CHANGE MATERIALS; N-TYPE PBTE; ELECTRONIC-STRUCTURE; SURFACE-PLASMONS; DIELECTRIC FILMS; DOMAIN-WALLS; THIN-FILMS;
D O I
10.1002/nano.202000020
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The physical properties of functional materials are closely related to the intrinsic symmetry and applied fields, wherein symmetry breaking under external fields generates functionalities for functional materials that underlie various technological applications. Understanding the origin of functionalities requires us to determine the precise atomic structure and electronic configurations of functional materials in the broken-symmetry states, thereby establishing the direct correlation between the structural details and functional properties of materials. The recent advances in aberration-corrected transmission electron microscopy (TEM) have enabled real-space imaging and spectroscopy at sub-angstrom resolution with extraordinary sensitivity to structure, chemistry, and bonding, providing great opportunities to bridge the gap between structure and functionality. Here we present case studies highlighting the utility of advanced TEM in understanding the origin of functionality for functional materials, alongside these examples is a discussion of the physical underpinnings of specific functional properties. We then conclude with a personal perspective on future directions as well as fundamental challenges.
引用
收藏
页码:183 / 199
页数:17
相关论文
共 50 条
  • [1] Atomic-scale imaging of ultrafast materials dynamics
    Flannigan, David J.
    Lindenberg, Aaron M.
    MRS BULLETIN, 2018, 43 (07) : 485 - 490
  • [2] Nuclear reactor materials at the atomic scale
    Marquis, Emmanuelle A.
    Hyde, Jonathan M.
    Saxey, David W.
    Lozano-Perez, Sergio
    de Castro, Vanessa
    Hudson, Daniel
    Williams, Ceri A.
    Humphry-Baker, Samuel
    Smith, George D. W.
    MATERIALS TODAY, 2009, 12 (11) : 30 - 37
  • [3] Concepts for simulating and understanding materials at the atomic scale
    Finnis, M. W.
    MRS BULLETIN, 2012, 37 (05) : 477 - 484
  • [4] Generation of reasonable atomic model structures of amorphous materials for atomic scale simulations
    Leitsmann, R.
    Boehm, O.
    Plaenitz, Ph.
    Schreiber, M.
    COMPUTATIONAL AND THEORETICAL CHEMISTRY, 2015, 1059 : 7 - 11
  • [5] The Atomic Circus: Small Electron Beams Spotlight Advanced Materials Down to the Atomic Scale
    Wu, Haijun
    Zhao, Xiaoxu
    Guan, Cao
    Zhao, Li-Doug
    Wu, Jiagang
    Song, Dongsheng
    Li, Changjian
    Wang, John
    Loh, Kian Ping
    Venkatesan, Thirumalai V.
    Pennycook, Stephen J.
    ADVANCED MATERIALS, 2018, 30 (47)
  • [6] Advance in additive manufacturing of 2D materials at the atomic and close-to-atomic scale
    Chen, Yixin
    Fang, Fengzhou
    Zhang, Nan
    NPJ 2D MATERIALS AND APPLICATIONS, 2024, 8 (01)
  • [7] Atomic-scale mapping of interface reconstructions in multiferroic heterostructures
    Huang, Weichuan
    Yin, Yuewei
    Li, Xiaoguang
    APPLIED PHYSICS REVIEWS, 2018, 5 (04):
  • [8] Shifting atomic patterns: on the origin of the different atomic-scale patterns of graphite as observed using scanning tunnelling microscopy
    Wong, H. S.
    Durkan, C.
    NANOTECHNOLOGY, 2012, 23 (18)
  • [9] In situ and operando force-based atomic force microscopy for probing local functionality in energy storage materials
    Gao, Qiang
    Tsai, Wan-Yu
    Balke, Nina
    ELECTROCHEMICAL SCIENCE ADVANCES, 2022, 2 (01):
  • [10] Atomic Solid State Energy Scale
    Pelatt, Brian D.
    Ravichandran, Ram
    Wager, John F.
    Keszler, Douglas A.
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2011, 133 (42) : 16852 - 16860