Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society

被引：0

作者：

Rupe, Jason ^{[1
]}

Laplante, Phil ^{[2
]}

Shieh, Shiuhpyng Winston ^{[3
]}

机构：

[1] CableLabs, Louisville, CO 80027 USA

[2] NIST, Gaithersburg, MD USA

[3] Natl Yang Ming Chiao Tung Univ, Taipei, Taiwan

来源：

IEEE TRANSACTIONS ON RELIABILITY | 2024年 / 73卷 / 01期

关键词：

Special issues and sections; Reliability engineering; IEEE Societies; IEEE publishing; PROCESS MODEL;

D O I：

10.1109/TR.2024.3366027

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Seventy-five years ago, visionaries in the field of reliability engineering came together to establish the IEEE Reliability Society, marking the commencement of a remarkable journey toward enhancing the dependability, resilience, and security of technological systems. As we celebrate this significant milestone, it is an opportune moment to reflect on the society's illustrious history, achievements, and the enduring impact it has had on the world of technology.

引用

页码：3 / 6

页数：4

共 2 条

[1] IEEE Signal Processing Society: Celebrating 75 Years of Remarkable Achievements [From the Guest Editors]
Guido, Rodrigo Capobianco
Adali, Tulay
Bjoernson, Emil
Blanc-Feraud, Laure
Braga-Neto, Ulisses
Ghoraani, Behnaz
Jutten, Christian
Van der Veen, Alle-Jan
Zhao, Hong Vicky
Zhu, Xiaoxing
IEEE SIGNAL PROCESSING MAGAZINE, 2023, 40 (04) : 3 - 6
[2] 75 Years of IEEE AP-S Research in Computational Electromagnetics: A view on the discipline and its history, current state, and future prospects
Notaros, Branislav M.
IEEE ANTENNAS AND PROPAGATION MAGAZINE, 2024, 66 (03) : 68 - 83

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