Test method and failure rate of the single-particle effect of a relay protection device

被引：0
|
作者：
Ding X. [1 ]
Chen Z. [1 ]
Zhou Z. [2 ,3 ]
Zhang Y. [2 ,3 ]
机构：
[1] Dispatching Center of China Southern Power Grid, Guangzhou
[2] Guodian Nanjing Automation Co., Ltd., Nanjing
[3] Nanjing SAC Power Grid Automation Co., Ltd., Nanjing
来源：
Dianli Xitong Baohu yu Kongzhi/Power System Protection and Control | 2022年 / 50卷 / 24期
关键词：
accelerated neutron irradiation test; failure rate; relay protection; single-event effect; soft errors;
D O I：
10.19783/j.cnki.pspc.220310
中图分类号：
学科分类号：
摘要：
Memory soft errors induced by the single-particle effect have a non-negligible effect on microcomputer relay protection. This paper introduces the sources of Alpha particles and high-energy neutrons, as well as atmospheric neutron fluxes in some cities in China. The details of the neutron irradiation tests on relay protection devices and the method of obtaining the single particle failure rate in the field environment based on experimental data are discussed. Based on the existing reliability metrics, the acceptable failure rate of the single-particle effect of the relay protection device is promoted. Comparing this indicator with the failure rate obtained by the irradiation test, it can be judged whether the device fulfills the requirements of field operation. This method has a certain reference significance for evaluating the failure efficiency of single particles of relay protection devices. © 2022 Power System Protection and Control Press. All rights reserved.
引用
收藏
页码：167 / 171
页数：4
相关论文
共 24 条
  • [1] (2016)
  • [2] JESD89A: measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices, (2006)
  • [3] ZHOU Hao, SHI Lei, PENG Tao, Et al., Analysis and countermeasures of single event upset soft errors in a relay protection device, Power System Protection and Control, 49, 7, pp. 144-149, (2021)
  • [4] LI Youjun, ZHOU Hualiang, ZHENG Yuping, Et al., Error-tolerant design and application of relay protection device against unexpected memory bit change, Automation of Electric Power Systems, 45, 7, pp. 155-162, (2021)
  • [5] GORDON M S, GOLDHAGEN P, RODBELL K P, Et al., Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground, IEEE Transactions on Nuclear Science, 51, 6, pp. 3427-3434, (2004)
  • [6] ZHANG Zhangang, LEI Zhifeng, HUANG Yun, Et al., Experimental study on real-time measurement of atmospheric-neutron induced single event effect based on high-altitude area, Atomic Energy Science and Technology, 56, 4, pp. 725-733, (2022)
  • [7] ZHANG Zhangang, LEI Zhifeng, TONG Teng, Et al., Tibetan-plateau-based real-time testing and simulations of single-bit and multiple-cell upsets in QDRII+ SRAM devices, IEEE Transactions on Nuclear Science, 66, 7, pp. 1368-1373, (2019)
  • [8] WANG Xun, ZHANG Fengqi, CHEN Wei, Et al., Application and evaluation of Chinese spallation neutron source in single-event effects testing, Acta Physica Sinica, 68, 5, pp. 38-47, (2019)
  • [9] XILINX: device reliability report (second half 2020), UG116(v10.13), (2020)
  • [10] NGUYEN H T, YAGIL Y, SEIFERT N, Et al., Chip-level soft error estimation method, IEEE Transactions on Device and Materials Reliability, 5, 3, pp. 365-381, (2005)
123