A Method for Optimal Value Measurement of Some Parameters of Fault Attacks on Cryptographic Algorithms

被引：0
作者：
Zuev, Yu. A. [1 ]
Klyucharev, P.G. [1 ]
机构：
[1] Bauman Moscow State Technical University, Moscow
来源：
Journal of Applied and Industrial Mathematics | 2024年 / 18卷 / 02期
关键词：
dynamic programming; fault attack;
D O I：
10.1134/S1990478924020182
中图分类号：
学科分类号：
摘要：
Abstract: This paper is devoted to the construction of a time-optimal method for measuring themaximum permissible (critical) value of the supply voltage (as well as other parameters) of thedevice on which the cryptographic algorithm is performed. Knowledge of these values is necessaryfor successful conduct of error injection, as part of a fault attack. The method is based ondynamic programming. © Pleiades Publishing, Ltd. 2024.
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页码：371 / 377
页数：6
相关论文
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