Remarkable enhancement in piezoelectric performance of [001] textured Na 0.4 K 0.1 Bi 0.5 TiO 3 ceramic

This study explores the dependence of dielectric and piezoelectric properties on the grain morphology, orientation, and electric field in the [001] textured Na 0.4 K 0.1 Bi 0.5 TiO 3 (NKBT-T) piezoceramics, fabricated via reactive template grain growth and tape -casting methods. A high degree of [001] texturing with Lotgering factor ( f ) of -0.92 was confirmed by X-ray diffraction, electron backscattered diffraction, and bulk texture measurements. A large average plate length of -8.5 +/- 1 mu m with an aspect ratio of -11 was achieved in NKBT-T ceramic. An extremely large value of piezoelectric voltage coefficient ( g 33 ) of -100x10 - 3 Vm/N was observed in poled NKBT-T ceramics, originating from a low dielectric constant (-230) and high piezoelectric charge coefficient ( d 33 -205 pC/N). The transduction coefficient ( d 33 center dot g 33 ) of NKBT-T ceramic was estimated at -20,000 x 10 -15 m 2 N -1 and the mechanical energy harvesting responses of -1.8 mu A and -4 V were recorded in the NKBT-T ceramic -based piezoelectric device.