Testing Technologies for Analog/Mixed-Signal Circuits in IoT Era

被引：0
作者：
Kobayashi H. [1 ]
Kuwana A. [1 ]
Wei J. [1 ]
Tsukiji N. [1 ]
Zhao Y. [1 ]
机构：
[1] Gunma University, 1-5-1, Tenjin-cho, Kiryu, Gunma
来源：
IEEJ Transactions on Electronics, Information and Systems | 2021年 / 141卷 / 01期
关键词：
Analog circuit test; Built-in self-test; Built-out self-test; Design-for-test; Mixed-signal circuit test;
D O I：
10.1541/ieejeiss.141.1
中图分类号：
学科分类号：
摘要：
This paper reviews production testing issues for analog and mixed-signal SoC in IoT era for analog circuit designers, and also introduces research examples including authors’ group research results in this area. Notice that production testing and measurement/characterization for ICs are similar but different, and this paper introduces the former. For IoT systems and automotive applications, analog and mixed-signal circuit testing is very important to realize their reliability at low cost, and there are a lot of technology challenges. Their overview including future technology challenges is described. © 2021 The Institute of Electrical Engineers of Japan.
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页码：1 / 12
页数：11
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