The future of optical measurement technology: A review of new developments in optical metrology and industry trends in the digitalization and integration of these solutions for in situ and inline measurements

被引：0

作者：

Castelo-Porta, Antonio ^{[1
]}

机构：

[1] EPIC – European Photonics Consortium Industry, 17 Rue Hamelin, Paris, France

来源：

PhotonicsViews | 2023年 / 20卷 / 02期

关键词：

Optical variables measurement;

D O I：

10.1002/phvs.202300015

中图分类号：

学科分类号：

摘要：

Optical metrology is one of the key technologies in today's manufacturing industry. It can be generally defined as the science of measuring with light, and it is widely used to evaluate the physical properties of products (or some of their parts or components) and to monitor large infrastructures and facilities. In this article we will review some of the current technologies for optical measurement in different manufacturing industries, the new developments and the trends related to the continuous demand for high- precision and high-efficiency solutions. © 2023 Wiley-VCH GmbH.

引用

页码：72 / 75