Simultaneous Measurement System of Thickness and Temperature of Two-Wavelength Dynamic Liquid Film

被引：0
|
作者：
Yang H. [1 ]
Deng H. [1 ]
Jiang Y. [1 ]
Zhang Y. [1 ]
Su M. [1 ]
机构：
[1] School of Energy and Power Engineering, University of Shanghai for Science and Technology, Shanghai
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2019年 / 46卷 / 04期
关键词：
Diode-laser absorption spectroscopy; Liquid film; Measurement; Spectroscopy technique; Temperature; Thickness;
D O I：
10.3788/CJL201946.0404011
中图分类号：
学科分类号：
摘要：
A simultaneous measurement system based on the diode-laser absorption spectroscopy (DLAS) technique is developed to simultaneously measure the thickness and temperature of a dynamic liquid film with high accuracy. The measurement accuracy of this system is validated by a calibration tool and the results show that the average measurement errors of film thickness and temperature are 4.58% and 1.34%, respectively. On this basis, this system is employed to study the evaporation process of the liquid film on a horizontal quartz glass plate and the results indicate that the average evaporation rate of this liquid film is 0.34 μm/s and the evaporation rate increases with the increase of film temperature. Moreover, the results by DLAS, imaging method and thermocouple are well consistent. In addition, the system is applied to the dynamic liquid film in a flow channel and the results disclose that under different film temperatures of 308, 315 and 323 K, the average thicknesses of the liquid film are basically consistent and they fluctuates for 11 times within one second, while the film temperature is almost constant. © 2019, Chinese Lasers Press. All right reserved.
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