Analysis of crosstalk noise in coupled MWCNT interconnects using MRTD technique

被引:1
作者
Gugulothu, Bhaskar [1 ]
Naik, B. Rajendra [2 ]
机构
[1] JNTUH, VBIT, Dept ECE, Hyderabad, India
[2] UCEOU, Dept ECE, Hyderabad, India
来源
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2024年 / 30卷 / 11期
关键词
NEXT-GENERATION INTERCONNECTS; TRANSIENT ANALYSIS; MODEL; DISPERSION;
D O I
10.1007/s00542-024-05666-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, the effect of crosstalk noise in a mutually coupled multiwalled carbon nanotube (MWCNT) interconnect were investigated. The multiresolution time-domain method (MRTD) is used to analyze the crosstalk noise model. On the victim line of MWCNT interconnects, the worst-case propagation delay and peak voltage have been measured and compared to those obtained using the conventional finite difference time domain (FDTD) method, and HSPICE simulations for the 22 nm technology node have been validated. The results of the proposed method shows that the crosstalk induced propagation delays in both dynamic in-phase, out-phase, and peak voltage timing and peak voltage in functional crosstalk of the MWCNT interconnects are an average error less than 2% for the proposed model and conventional FDTD model with HSPICE simulations. It has been observed that the simulation results of the proposed model match accurately with HSPICE and dominate the conventional FDTD model. For various cases of input switching, the proposed numerical model is extremely time efficient and effective in evaluating crosstalk mediated propagation delay and peak voltages. The suggested approach could also be used to fix problems including electromagnetic interference and on-chip interconnect reliability.
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页码:1501 / 1514
页数:14
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