Efficient grouping approach for fault tolerant weight mapping in memristive crossbar array

被引:0
作者
Yadav, Dev Narayan [1 ]
Thangkhiew, Phrangboklang Lyngton [2 ]
Chakraborty, Sandip [1 ]
Sengupta, Indranil [1 ,3 ]
机构
[1] Department of Computer Science and Engineering, Indian Institute of Technology, Kharagpur
[2] Department of Computer Science and Engineering, Indian Institute of Information Technology, Guwahati
[3] Department of Computer Science and Engineering, JIS University
来源
Memories - Materials, Devices, Circuits and Systems | 2023年 / 4卷
关键词
Fault-tolerance; Memristor; Neural network; Resistive memory; Weight-mapping;
D O I
10.1016/j.memori.2023.100045
中图分类号
学科分类号
摘要
The ability of resistive memory (ReRAM) to naturally conduct vector–matrix multiplication (VMM), which is the primary operation carried out during the training and inference of neural networks, has caught the interest of researchers. The memristor crossbar is one of the desirable architectures to perform VMM because it offers various benefits over other memory technologies, including in-memory computing, low power, and high density. Direct downloading and chip-on-the-loop approaches are typically used to train ReRAM-based neural networks. In these methods, all weight computations are carried out by a host machine, and the computed weights are downloaded in the crossbar. It has been seen that the network does not deliver the same precision as promised by the host system once the weights have been downloaded. This is because crossbars contain a significant number of faulty memristors and suffer from cell resistance variations because of immature manufacturing technologies. As a result, a cell may not be able to take the exact weight values that the host system generates, and may lead to incorrect inferences. Existing techniques for fault-tolerant mapping either involve network retraining or employ a graph-matching strategy that comes with hardware, power, and latency overheads. In this paper, we propose a mapping method to tolerate the effect of defective memristors. In order to lessen the impact of faulty memristors, the mapping is done in a way that allows network weights to cover up faulty memristors. Further, this work prioritizes the different faults based on the frequency of occurrence. The mapping efficiency is found to increase significantly with low power, area and latency overheads in the proposed approach. Experimental analyses show considerable improvement as compared to state-of-the-art works. © 2023 The Author(s)
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