Special Section on Solid-State Circuit Design - Architecture, Circuit, Device and Design Methodology

被引：0

作者：

Takahashi, Masafumi ^{[1
]}

机构：

[1] Kioxia Corp., Japan

来源：

IEICE Transactions on Electronics | 2022年 / E105.C卷 / 07期

关键词：

All Open Access; Bronze;

D O I：

10.1587/transele.2021CDF0001

中图分类号：

学科分类号：

摘要：

引用

共 16 条

[1] Special Section on Analog Circuit Techniques and Related Topics
Muto, Cosy
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2023, E106A (05) : 816 - 816
[2] The Design of a Bootstrapped Sampling Circuit [The Analog Mind]
Razavi B.
IEEE Solid-State Circuits Magazine, 2021, 13 (01): : 7 - 12
[3] Safety in the battery design: The short circuit
Conte, Fiorentino Valerio
Gollob, Peter
Lacher, Hannes
World Electric Vehicle Journal, 2009, 3 (04): : 719 - 726
[4] Special Section on Signal Design and Its Applications in Communications
Fan, Pingzhi
Kojima, Tetsuya
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2023, E106A (12) : 1450 - 1451
[5] Special Section on Design Methodologies for System on a Chip FOREWORD
Hamaguchi, Kiyoharu
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2019, E102A (07) : 866 - 866
[6] Regression and ANN Models for Electronic Circuit Design
Dieste-Velasco, M. I.
Diez-Mediavilla, M.
Alonso-Tristan, C.
COMPLEXITY, 2018,
[7] Special section on design for resilience in cyber-physical systems
2018, Institute of Electrical and Electronics Engineers Inc.
[8] Introduction to the Special Issue on the 2020 IEEE International Solid-State Circuits Conference (ISSCC)
Gerfers, Friedel
Hsieh, Ping-Hsuan
Markovc, Dejan
Deguchi, Jun
Karl, Eric
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2021, 56 (01) : 3 - 6
[9] Special issue: Performance issues in computer architecture and design
Nelson, DB
CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE, 2005, 17 (10): : 1215 - 1218
[10] Timing and area optimization for standard-cell VLSI circuit design
AT&T Bell Lab, Murray Hill, United States
IEEE Trans Comput Aided Des Integr Circuits Syst, 3 (308-320):

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