Characterization of microstructures by X-ray diffraction line profile analysis ⅱ．: Line profile analysis using synchrotron radiation

被引：0
|
作者：
Shobu T. [1 ]
Shiro A. [2 ]
Yoshida Y. [3 ]
机构：
[1] Sector of Nuclear science research, Japan Atomic Energy Agency, Sayo-gun, Hyogo
[2] Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology, Sayo-gun, Hyogo
[3] Kitami Institute of Technology, Koen-cho, Kitami
来源：
Zairyo/Journal of the Society of Materials Science, Japan | 2020年 / 69卷 / 04期
关键词：
Dislocation density; In-situ measurement; Line profile analysis; Synchrotron radiation;
D O I：
10.2472/jsms.69.343
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：343 / 347
页数：4
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