Characterization of microstructures by X-ray diffraction line profile analysis ⅱ.: Line profile analysis using synchrotron radiation

被引:0
作者
Shobu T. [1 ]
Shiro A. [2 ]
Yoshida Y. [3 ]
机构
[1] Sector of Nuclear science research, Japan Atomic Energy Agency, Sayo-gun, Hyogo
[2] Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology, Sayo-gun, Hyogo
[3] Kitami Institute of Technology, Koen-cho, Kitami
关键词
Dislocation density; In-situ measurement; Line profile analysis; Synchrotron radiation;
D O I
10.2472/jsms.69.343
中图分类号
学科分类号
摘要
[No abstract available]
引用
收藏
页码:343 / 347
页数:4
相关论文
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