Demystifying the Semiconductor-to-Metal Transition in Amorphous Vanadium Pentoxide: The Role of Substrate/Thin Film Interfaces

被引:3
作者
Esther, A. Carmel Mary [1 ]
Muralikrishna, G. Mohan [1 ,2 ]
Chirumamilla, Manohar [3 ,4 ]
Pinto, Manoel da Silva [1 ]
Ostendorp, Stefan [1 ]
Peterlechner, Martin [1 ]
Yu Petrov, Alexander [3 ,5 ]
Eich, Manfred [3 ,5 ]
Divinski, Sergiy V. [1 ]
Hahn, Horst [2 ,6 ]
Wilde, Gerhard [1 ]
机构
[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany
[2] Karlsruhe Inst Technol, Inst Nanotechnol INT, Kaiser Str 12, D-76131 Karlsruhe, Germany
[3] Hamburg Univ Technol, Inst Opt & Elect Mat, Eissendorfer Str 38, D-21073 Hamburg, Germany
[4] Aalborg Univ, Skjernvej 4A, DK-9220 Aalborg, Denmark
[5] Helmholtz Zentrum Hereon, Max Planck Str 1, D-21502 Geesthacht, Germany
[6] Univ Oklahoma, Sch Sustainable Chem Biol & Mat Engn, 100 E Boyd St, Norman, OK 73019 USA
关键词
electron energy-loss spectroscopy; ellipsometry; in situ transmission electron microscopy; in situ secondary Ion mass spectroscopy; phase transition; semiconductor to metal transition; vanadium oxide; THIN-FILMS; PHASE-TRANSITION; OXIDE FILMS; V2O5; VO2; DECOMPOSITION;
D O I
10.1002/adfm.202309544
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The precise mechanism governing the reversible semiconductor-to-metal transition (SMT) in V2O5 remains elusive, yet its investigation is of paramount importance due to the remarkable potential of V2O5 as a versatile "smart" material in advancing optoelectronics, plasmonics, and photonics. In this study, distinctive experimental insights into the SMT occurring in amorphous V2O5 through the application of highly sensitive, temperature-dependent, in situ analyses on a V2O5 thin film deposited on soda-lime glass are presented. The ellipsometry measurements reveal that the complete SMT occurs at approximate to 340 degrees C. Remarkably, the refractive index and extinction coefficients exhibit reversible characteristics across visible and near-infrared wavelengths, underscoring the switch-like behavior inherent to V2O5. The findings obtained from ellipsometry are substantiated by calorimetry and in situ secondary ion mass spectrometry analyses. In situ electron microscopy observations unveil a separation of oxidation states within V2O5 at 320 degrees C, despite the thin film retaining its amorphous state. The comprehensive experimental investigations effectively demonstrate that alterations in electronic state can trigger the SMT in amorphous V2O5. It is revealed for the first time that the SMT in V2O5 is solely contingent upon electronic state changes, independent of structural transitions, and importantly, it is a reversible transformation within the amorphous state itself. Unveiling the Mystery: The reversible semiconductor-to-metal Transition in amorphous V2O5. This study employs advanced, temperature-dependent in situ analyses, providing compelling evidence for the elusive phenomenon. Through meticulous investigation, the specific conditions triggering this transition are identified. The findings demonstrate that changes in the electronic state serve as the driving force behind the semiconductor-to-metal Transition, preserving its amorphous structure of V2O5 without necessitating any structural transformations. image
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页数:10
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