Analysis of EM Fault Injection on Bit-sliced Number Theoretic Transform Software in Dilithium

被引:2
|
作者
Singh, Richa [1 ]
Islam, Saad [1 ]
Sunar, Berk [1 ]
Schaumont, Patrick [1 ]
机构
[1] Worcester Polytechn Inst, 100 Inst Rd, Worcester, MA 01609 USA
关键词
Dilithium; bit-slicing; intra-instruction redundancy; fault attack countermeasure; ARM Cortex-A9; electromagnetic fault injection; AES;
D O I
10.1145/3583757
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Bitslicing is a software implementation technique that treats an N-bit processor datapath as N parallel single-bit datapaths. Bitslicing is particularly useful to implement data-parallel algorithms, algorithms that apply the same operation sequence to every element of a vector. Indeed, a bit-wise processor instruction applies the same logical operation to every single-bit slice. A second benefit of bitsliced execution is that the natural spatial redundancy of bitsliced software can support countermeasures against fault attacks. A k-redundant program on an N-bit processor then runs as N/k parallel redundant slices. In this contribution, we combine these two benefits of bitslicing to implement a fault countermeasure for the number-theoretic transform (NTT). The NTT efficiently implements a polynomial multiplication. The internal symmetry of the NTT algorithm lends itself to a data-parallel implementation, and hence it is a good candidate for the redundantly bitsliced implementation. We implement a redundantly bitsliced NTT on an advanced 667MHz ARM Cortex-A9 processor, and study the fault coverage for the protected NTT under optimized electromagnetic fault injection (EMFI). Our work brings two major contributions. First, we show for the first time how to develop a redundantly bitsliced version of the NTT. We integrate the protected NTT into a full Dilithium signature sequence. Second, we demonstrate an EMFI analysis on a prototype implementation of the Dilithium signature sequence on ARM Cortex-M9. We perform a detailed EM fault-injection parameter search to optimize the location, intensity and timing of injected EM pulses. We demonstrate that, under optimized fault injection parameters, about 10% of the injected faults become potentially exploitable. However, the redundantly bitsliced NTT design is able to catch the majority of these potentially exploitable faults, even when the remainder of the Dilithium algorithm as well as the control flow is left unprotected. To our knowledge, this is the first demonstration of a bitslice-redundant design of the NTT that offers distributed fault detection throughout the execution of the algorithm.
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页数:27
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