Chemical Interface Structures in CdS/RbInSe2/Cu(In,Ga)Se2 Thin-Film Solar Cell Stacks

被引:2
|
作者
Bombsch, Jakob [1 ]
Kodalle, Tim [2 ]
Garcia-Diez, Raul [1 ]
Hartmann, Claudia [1 ]
Felix, Roberto [1 ]
Ueda, Shigenori [3 ,4 ]
Wilks, Regan G. [1 ,5 ]
Kaufmann, Christian A. [2 ]
Baer, Marcus [1 ,5 ,6 ,7 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie GmbH HZB, Dept Interface Design, D-12489 Berlin, Germany
[2] HZB, PVcomB, D-12489 Berlin, Germany
[3] Natl Inst Mat Sci NIMS, Synchrotron X Ray Stn SPring 8, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan
[4] NIMS, Res Ctr Elect & Opt Mat, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
[5] HZB, Energy Mat Insitu Lab Berlin EMIL, D-12489 Berlin, Germany
[6] Helmholtz Inst Renewable Energy HI ERN, Dept X Ray Spect Interfaces Thin Films, D-12489 Berlin, Germany
[7] Friedrich Alexander Univ Erlangen Nurnberg FAU, Dept Chem & Pharm, D-91054 Erlangen, Germany
关键词
chalcopyrite thin-film solar cells; HAXPES; RbF-PDT; RbInSe2; PHOTOELECTRON ANGULAR-DISTRIBUTION; MEAN FREE PATHS; SURFACE; SPECTROSCOPY; PARAMETERS; CDS;
D O I
10.1002/adfm.202403685
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Performance-enhancing heavy alkali-based post-deposition treatments (PDT) of Cu(In,Ga)Se-2 (CIGSe) thin-film solar cells absorbers often induce the formation of a Rb- In-Se phase on the CIGSe absorber. Co-evaporation of an interfacial RbInSe2 (RISe) layer between buffer and absorber can also benefit cell performance. A detailed analysis of the chemical interface structures in CdS/RISe/CIGSe layer stacks is performed using hard X-ray photoelectron spectroscopy (HAXPES). For comparison, stacks without RISe and based on RbF PDT CIGSe absorbers are also studied. When aiming for the direct co-evaporation of a RISe layer on the CIGSe absorber, the formation of an additional In-Se phase is found. For the RbF PDT CIGSe absorbers, the study only finds small amounts of Rb and no indication for a RISe layer formation. Examining layer stacks prepared via additional chemical bath deposition (CBD) of CdS reveals a clear impact of the presence of Rb (or of Rb-containing species) on the CIGSe surface. In these cases, an increase of the induction/coalescence period is found at the beginning of the CBD buffer layer growth process and the formation of Cd & horbar;Se bonds; thereafter, a more compact CdS layer growth is observed.
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页数:8
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