Data-driven Prognostic Approaches for Semiconductor Manufacturing Process: A Review of Recent Works and Future Perspectives

被引:0
作者
El Jamal, Dima [1 ]
Ananou, Bouchra [1 ]
Graton, Guillaume [1 ,2 ]
Ouladsine, Mustapha [1 ]
Pinaton, Jacques [3 ]
机构
[1] Univ Toulon & Var, Aix Marseille Univ, CNRS, LIS,UMR 7020, F-13397 Marseille, France
[2] Ecole Cent Marseille, Marseille, France
[3] STMicroelect Rousset, F-13106 Rousset, France
关键词
prognostic; remaining useful life prediction; health indicator; data-driven approaches; semiconductor manufacturing; FAULT PROGNOSIS; BATCH PROCESSES; HEALTH; PREDICTION; DIAGNOSTICS; METHODOLOGY; EQUIPMENT; SYSTEMS; ISSUES;
D O I
10.1016/j.ifacol.2023.10.1539
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The manufacturing process of semiconductor devices is one of the most complex processes in manufacturing industry. The devices fabrication is performed through hundreds of sequential process steps with different recipes. The level of complexity is also increasing due to the high demands in terms of feature size and number of devices. Maintaining high yield and good quality production are the main objectives of these industries. These objectives can be achieved by adopting efficient maintenance strategies. In this context, a suitable prognostic model is required in order to schedule the maintenance actions. Among the different prognostic approaches, data-driven ones received a lot of attention since they do not require any specific knowledge for modeling these complex processes. Although the advances in data-driven prognostic works, there is a real lack of survey papers that overview and discuss the existing approaches for this industry over the past 10 years. Therefore, this paper presents a systematic overview of data-driven prognostic for semiconductor manufacturing. It investigates the different used methods, the challenges of their application and the unexplored research areas.
引用
收藏
页码:3716 / 3724
页数:9
相关论文
共 49 条
[11]  
Byington C. S., 2002, 2002 IEEE Aerospace Conference Proceedings (Cat. No.02TH8593), P6, DOI 10.1109/AERO.2002.1036120
[12]  
Dragomir O. E., 2009, 2009 EUR CONTR C ECC, P1587, DOI DOI 10.23919/ECC.2009.7074633
[13]   Fault detection using bispectral features and one-class classifiers [J].
Du, Xian .
JOURNAL OF PROCESS CONTROL, 2019, 83 :1-10
[14]  
El Jamal D., 2021, 2021 INT C CONTR AUT, P1
[15]   Health Indicator for Batch Processes Based on SP-LASSO [J].
El Jamal, Dima ;
Ananou, Bouchra ;
Graton, Guillaume ;
Ouladsine, Mustapha ;
Pinaton, Jacques .
IFAC PAPERSONLINE, 2022, 55 (06) :366-371
[16]   Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction [J].
El Jamal, Dima ;
Al-Kharaz, Mohammed ;
Ananou, Bouchra ;
Graton, Guillaume ;
Ouladsine, Mustapha ;
Pinaton, Jacques .
2021 IEEE INTERNATIONAL CONFERENCE ON PROGNOSTICS AND HEALTH MANAGEMENT (ICPHM), 2021,
[17]  
Engel SJ, 2000, AEROSP CONF PROC, P457, DOI 10.1109/AERO.2000.877920
[18]   Fatigue crack fault diagnosis and prognosis based on hidden semi-Markov model [J].
Fan, Lei ;
Wang, Shaoping ;
Duan, Haibin ;
Ran, Hongliang .
JOURNAL OF ENGINEERING-JOE, 2019, (13) :406-410
[19]   Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing [J].
Fan, Shu-Kai S. ;
Hsu, Chia-Yu ;
Tsai, Du-Ming ;
He, Fei ;
Cheng, Chun-Chung .
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2020, 17 (04) :1925-1936
[20]  
Heistracher C., 2022, arXiv