Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion-Implanted GaN

被引:7
作者
Kano, Emi [1 ]
Uzuhashi, Jun [2 ]
Kobayashi, Koki [3 ]
Ishikawa, Kosuke [3 ]
Sawabe, Kyosuke [3 ]
Narita, Tetsuo [4 ]
Sierakowski, Kacper [5 ]
Bockowski, Michal [3 ,5 ]
Ohkubo, Tadakatsu [2 ]
Kachi, Tetsu [1 ]
Ikarashi, Nobuyuki [1 ]
机构
[1] Nagoya Univ, Inst Mat & Syst Sustainabil, Nagoya, Aichi 4648601, Japan
[2] Natl Inst Mat Sci, Tsukuba 3050047, Japan
[3] Nagoya Univ, Grad Sch Engn, Dept Elect, Nagoya, Aichi 4648603, Japan
[4] Toyota Cent Res & Dev Labs Inc, Nagakute, Aichi 4801192, Japan
[5] Polish Acad Sci, Polish Acad Sci, Sokolowska 29-37, PL-01142 Warsaw, Poland
来源
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2024年 / 18卷 / 09期
关键词
GaN; Mg; N ion-implantation; transmission electron microscopy; ACTIVATION; TEMPERATURE;
D O I
10.1002/pssr.202400074
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In Mg ion implantation doping of GaN, sequential N ion implantation reportedly changes Mg concentrations in the Mg ion-implanted region and the underlying region after activation annealing. The impact of sequential N ion implantation on defects and Mg distribution after postimplantation annealing is investigated. The atomic-resolution analyses show that, in the Mg ion-implanted region, the N ion implantation increases the concentration of MgGa. It is thus concluded that the Mg soluble in GaN by Mg ion implantation is increased by N ion implantation. The rest of the Mg atoms agglomerate to form clusters on the extended defects, and their concentration is also increased by the N implantation. The coarsening of extended defects is suppressed by the N ion implantation: the defects in the Mg+N-implanted sample are nanoscale interstitial-type defects, and they do not grow or annihilate after annealing. This indicates that the N implantation changes the concentrations of interstitials. In Mg ion implantation doping of GaN, sequential N ion implantation reportedly changes Mg concentrations in the implanted region. The effects of N ion implantation on defects and Mg distribution are investigated. In the ion-implanted region, the N ion implantation increases Mg acceptor concentration. The remaining Mg atoms cluster on extended defects, with their concentration also increased by N implantation.image (c) 2024 WILEY-VCH GmbH
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页数:6
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