共 25 条
Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors
被引:0
作者:
Fang, Dongxing
[1
]
Nie, Kaiming
[1
]
Zhang, Ziyang
[1
]
Xu, Jiangtao
[1
]
机构:
[1] Tianjin Univ, Sch Microelect, Tianjin Key Lab Imaging & Sensing Microelect Techn, 92 Weijin Rd, Tianjin 300072, Peoples R China
基金:
中国国家自然科学基金;
关键词:
CMOS image sensors (CIS);
Two-step single-slope (TS-SS);
Analog-to-digital converter (ADC);
Ramp generator;
HIGH-SPEED;
D O I:
10.1007/s00034-024-02767-2
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents a two-step single-slope (TS-SS) analog-to-digital converter (ADC) for CMOS image sensors (CIS). The proposed TS-SS ADC divides the pixel signal into small and large signal regions using a precomparator. When quantizing large pixel signals, the TS-SS ADC enters accelerated mode, which leverages the differential topology of the ramp generator to speed up quantization. The accelerated mode reduces the row cycle, resulting in a 31.3% reduction at 320 MHz clock from 27.3 to 18.75 mu s. The designed 12-bit TS-SS ADC was designed in a 110 nm 1P4M CMOS technology, and its linearity was verified by process corner post-simulation and Monte Carlo simulation.
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页码:6097 / 6114
页数:18
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