Correlation of refractive index based and THz streaking arrival time tools for a hard X-ray free-electron laser

被引：0

作者：

Blachucki, Wojciech ^{[2
]}

Johnson, Philip J. M. ^{[1
]}

Usov, Ivan ^{[1
]}

Divall, Edwin ^{[1
]}

Cirelli, Claudio ^{[1
]}

Knopp, Gregor ^{[1
]}

Juranic, Pavle ^{[1
]}

Patthey, Luc ^{[1
]}

Szlachetko, Jakub ^{[3
]}

Lemke, Henrik ^{[1
]}

Milne, Christopher ^{[1
,4
]}

Arrell, Christopher ^{[1
]}

机构：

[1] Paul Scherrer Inst, SwissFEL, CH-5232 Villigen, Switzerland

[2] Polish Acad Sci, Inst Nucl Phys, PL-31342 Krakow, Poland

[3] Jagiellonian Univ, Natl Synchrotron Radiat Ctr Solaris, PL-30387 Krakow, Poland

[4] European XFEL GmbH, D-22869 Schenefeld, Germany

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2024年 / 31卷 / Pt 2期

关键词：

X-ray free-electron lasers; timing tools; THz streaking; spatial encoding; SWISSFEL;

D O I：

10.1107/S1600577523010500

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

To fully exploit ultra-short X-ray pulse durations routinely available at X-ray free-electron lasers to follow out-of-equilibrium dynamics, inherent arrival time fluctuations of the X-ray pulse with an external perturbing laser pulse need to be measured. In this work, two methods of arrival time measurement were compared to measure the arrival time jitter of hard X-ray pulses. The methods were photoelectron streaking by a THz field and a transient refractive index change of a semiconductor. The methods were validated by shot-to-shot correction of a pump-probe transient reflectivity measurement. An ultimate shot-to-shot full width at half-maximum error between the devices of 19.2 +/- 0.1 fs was measured.

引用

页码：233 / 242

页数：10

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