Synthetic data augmentation for high-resolution X-ray welding defect detection and classification based on a small number of real samples

被引:11
作者
Li, Liangliang [1 ]
Wang, Peng [2 ]
Ren, Jia [1 ,3 ]
Lu, Zhigang [1 ,2 ]
Li, Xiaoyan [2 ]
Gao, Hui [2 ]
Di, RuoHai [2 ]
机构
[1] Xian Technol Univ, Sch Mechatron Engn, Xian 710021, Peoples R China
[2] Xian Technol Univ, Sch Elect & Informat Engn, Xian 710021, Peoples R China
[3] Hainan Univ, Sch Informat & Commun Engn, Haikou 570228, Peoples R China
关键词
Welding defects; Data augmentation; Convolutional neural networks; Deep learning; GAN;
D O I
10.1016/j.engappai.2024.108379
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Deep learning has become the dominant technology in most computer vision tasks. These methods often rely on a large number of labeled sample datasets for training, and in the field of non-destructive testing of welds in industrial manufacturing, weld images with defects are very scarce, and it is still a challenging challenge to construct high -resolution weld defect datasets that meet the requirements. To overcome this limitation, a new data augmentation method for high -resolution X-ray welding defect classification and synthesis based on a small number of real samples is proposed to realize the data augmentation of industrial nondestructive inspection Xray film defect images. Firstly, to overcome the scarcity of the weld X-ray defect classification dataset, the weld X-ray defect classification dataset (Weld Defect Classification, WDC) is constructed. Secondly, the performance of 16 common deep classification models on WDC datasets is explored. Then, the images of the real local welding defects and the non -defective weld area are fused at random locations, and two data augmentation modes, (Single Image Single Defect, SISD) and (Single Image Multi Defects, SIMD), can generate defect files and annotation files (Visual Object Classes, VOC) at the same time, which can save a lot of time for manual marking. Finally, compared with the traditional data augmentation method, the proposed method can effectively improve the accuracy of defect detection and generalization, the mAP (Mean Average Precision, mAP) @0.5 of YOLOV8X (You Only Look Once, YOLO) and YOLOV5.6.1X is 66.6% and 72.8%, which provides an effective solution for data sample generation in the industrial field.
引用
收藏
页数:13
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