Investigating the potential of cobalt-doped zinc oxide (Zn1-xCoxOδ) as a buffer layer for CZTS thin-film solar cells

被引:3
作者
Abdullah, Huda [1 ,2 ]
Xian, Kang Jian [1 ]
Hamzah, Muhammad Nurhayat Amir [1 ]
Naim, Norshafadzila Mohammad [1 ]
Bais, Badariah [1 ,2 ]
Mohmad, Abdul Rahman [2 ,3 ]
Sampe, Jahariah [3 ]
Yuliarto, Brian [4 ]
Othman, Mohd Hafiz Dzarfan [5 ]
Fen, Yap Wing [6 ]
Septiani, Ni Luh Wulan [7 ]
机构
[1] Univ Kebangsaan Malaysia, Fac Engn & Built Environm, Dept Elect Elect & Syst Engn, Bangi 43600, Malaysia
[2] Univ Kebangsaan Malaysia, Adv Semicond Mat & Devices, Bangi 43600, Malaysia
[3] Univ Kebangsaan Malaysia, Inst Microengn & Nanoelect, Bangi 43600, Malaysia
[4] Inst Teknol Bandung, Fac Ind Technol, Engn Phys Dept, Bandung 40132, Indonesia
[5] Univ Teknol Malaysia, Adv Membrane Technol Res Ctr AMTEC, Sch Chem & Energy Engn, Johor Baharu 81310, Johor, Malaysia
[6] Univ Putra Malaysia, Fac Sci, Dept Phys, Serdang 43400, Selangor, Malaysia
[7] Natl Res & Innovat Agcy Republ Indonesia, KST BJ Habibie, Res Ctr Adv Mat, South Tangerang 15134, Indonesia
关键词
PULSED-LASER DEPOSITION; OPTICAL-PROPERTIES; GEL SYNTHESIS; BAND-GAP; CO; PHOTOANODES;
D O I
10.1007/s10854-024-12851-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Copper zinc tin sulfide (CZTS) solar cells are one of the most promising possible substitutes for chalcopyrite copper indium gallium selenide (CIGS) in the future photovoltaic industry. This work reports on the preparation and characterization of a cobalt-doped zinc oxide (Zn1-xCoxO delta) thin-film buffer layer using the spin-coating technique on ITO back contact glass substrates. The effect of cobalt-doped zinc oxide on the structural, optical, morphological, and electrical properties of the obtained films has been investigated. The prepared thin-films were analyzed by several different characterization techniques such as X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), ultraviolet-visible (UV-Vis) spectroscopy and current density-voltage. (J-V) measurements. XRD analysis indicates all Zn1-xCoxO delta buffer layer films possess the wurtzite hexagonal polycrystalline structure with orientation (0 0 2). The images from FESEM analysis indicate the cross-sectional area and internal structure of Zn1-xCoxO delta buffer layer. The UV-Vis optical band gaps of the films were found to be in the range of 3.53-3.97 eV. The electrical analysis shows that the conductivity of cobalt-doped ZnO increases compared to the pure ZnO film without doping. The highest power conversion efficiency (PCE) of Zn0.91Co0.09O delta is 0.54%. The analysis on cobalt-doped ZnO film showed that cobalt and zinc oxide are good candidates and potential for optoelectronic applications such as the production of solar cells which involved transparent electrodes.
引用
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页数:10
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