Obtainment of molecular markers linked to BYDV resistance of wheat by RAPD

被引:0
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作者
朱其洪
贾旭
王京兆
李海健
张驰
庄家俊
王斌
机构
[1] Chinese Academy of Sciences
[2] China
[3] Beijing 100101
[4] State Key Laboratory of Plant Cell and Chromosome Engineering
[5] Institute of Genetics
关键词
BYDV resistance; molecular marker; RAPD; chromosome in situ hybridization;
D O I
暂无
中图分类号
S435.12 [麦类病虫害];
学科分类号
摘要
Wheat yellow dwarf(WYD) mused by the infection of barley yellow dwarf virus (BYDV) is the main disease of wheat. The yield loss caused by WYD has been estimated at 20%--30%。Three biosystems are associated with WYD: BYDV, vireos-transmitting aphid and wheat host. The creation of BYDV-resistant wheat lines is argued as the most efficient way to control WYD.Though some wheat lines have been reported to show toler-ance, there are few, if any, effective sources resisting to BYDV. In contrast, apparent re-sistances to BYDV have been described in many species of grass, such as Thinopyrum intermedium. Now, the BYDV-resistant genes of Thinopyrum interrnedium have been success-fully transferred to wheat through wide-cross. Using field-investigation to identify whether
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页码:60 / 63
页数:4
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