Resolution limit of label-free far-field microscopy

被引:0
作者
Evgenii Narimanov
机构
[1] Purdue University, School of Electrical Engineering, Birck Nanotechnology Center
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中图分类号
TH742 [显微镜];
学科分类号
0803 ;
摘要
The Abbe diffraction limit, which relates the maximum optical resolution to the numerical aperture of the lenses involved and the optical wavelength, is generally considered a practical limit that cannot be overcome with conventional imaging systems. However, it does not represent a fundamental limit to optical resolution, as demonstrated by several new imaging techniques that prove the possibility of finding the subwavelength information from the far field of an optical image. These include super-resolution fluorescence microscopy, imaging systems that use new data processing algorithms to obtain dramatically improved resolution, and the use of super-oscillating metamaterial lenses. This raises the key question of whether there is in fact a fundamental limit to the optical resolution, as opposed to practical limitations due to noise and imperfections, and if so then what it is. We derive the fundamental limit to the resolution of optical imaging and demonstrate that while a limit to the resolution of a fundamental nature does exist,contrary to the conventional wisdom it is neither exactly equal to nor necessarily close to Abbe's estimate.Furthermore, our approach to imaging resolution, which combines the tools from the physics of wave phenomena and the methods of information theory, is general and can be extended beyond optical microscopy, e.g., to geophysical and ultrasound imaging.
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页码:47 / 53
页数:7
相关论文
共 22 条
[1]   Near-Field Imaging of Free Carriers in ZnO Nanowires with a Scanning Probe Tip Made of Heavily Doped Germanium [J].
Sakat, Emilie ;
Giliberti, Valeria ;
Bollani, Monica ;
Notargiacomo, Andrea ;
Pea, Marialilia ;
Finazzi, Marco ;
Pellegrini, Giovanni ;
Hugonin, Jean-Paul ;
Weber-Bargioni, Alexander ;
Melli, Mauro ;
Sassolini, Simone ;
Cabrini, Stefano ;
Biagioni, Paolo ;
Ortolani, Michele ;
Baldassarre, Leonetta .
PHYSICAL REVIEW APPLIED, 2017, 8 (05)
[2]   Nanometer resolution imaging and tracking of fluorescent molecules with minimal photon fluxes [J].
Balzarotti, Francisco ;
Eilers, Yvan ;
Gwosch, Klaus C. ;
Gynna, Arvid H. ;
Westphal, Volker ;
Stefani, Fernando D. ;
Elf, Johan ;
Hell, Stefan W. .
SCIENCE, 2017, 355 (6325) :606-612
[3]  
Interscale mixing microscopy: far-field imaging beyond the diffraction limit[J] . Christopher M. Roberts,Nicolas Olivier,William P. Wardley,Sandeep Inampudi,Wayne Dickson,Anatoly V. Zayats,Viktor A. Podolskiy.Optica . 2016 (8)
[4]   Hyperstructured Illumination [J].
Narimanov, Evgenii .
ACS PHOTONICS, 2016, 3 (06) :1090-1094
[5]   Sparsity-based super-resolved coherent diffraction imaging of one-dimensional objects [J].
Sidorenko, Pavel ;
Kfir, Ofer ;
Shechtman, Yoav ;
Fleischer, Avner ;
Eldar, Yonina C. ;
Segev, Mordechai ;
Cohen, Oren .
NATURE COMMUNICATIONS, 2015, 6
[6]   Interscale mixing microscopy: numerically stable imaging of wavelength-scale objects with sub-wavelength resolution and far field measurements [J].
Inampudi, Sandeep ;
Kuhta, Nicholas ;
Podolskiy, Viktor A. .
OPTICS EXPRESS, 2015, 23 (03) :2753-2763
[7]   Sparsity-based single-shot subwavelength coherent diffractive imaging [J].
Szameit, A. ;
Shechtman, Y. ;
Osherovich, E. ;
Bullkich, E. ;
Sidorenko, P. ;
Dana, H. ;
Steiner, S. ;
Kley, E. B. ;
Gazit, S. ;
Cohen-Hyams, T. ;
Shoham, S. ;
Zibulevsky, M. ;
Yavneh, I. ;
Eldar, Y. C. ;
Cohen, O. ;
Segev, M. .
NATURE MATERIALS, 2012, 11 (05) :455-459
[8]   A super-oscillatory lens optical microscope for subwavelength imaging [J].
Rogers, Edward T. F. ;
Lindberg, Jari ;
Roy, Tapashree ;
Savo, Salvatore ;
Chad, John E. ;
Dennis, Mark R. ;
Zheludev, Nikolay I. .
NATURE MATERIALS, 2012, 11 (05) :432-435
[9]   Super-resolution and reconstruction of sparse sub-wavelength images [J].
Gazit, Snir ;
Szameit, Alexander ;
Eldar, Yonina C. ;
Segev, Mordechai .
OPTICS EXPRESS, 2009, 17 (26) :23920-23946
[10]   Super-Resolution without Evanescent Waves [J].
Huang, Fu Min ;
Zheludev, Nikolay I. .
NANO LETTERS, 2009, 9 (03) :1249-1254