A LOW-COST TESTER FOR BOUNDARY SCAN

被引：1

作者：

VANDEGOOR, AJ ^{[1
]}

VANTETERING, JAM ^{[1
]}

机构：

[1] BELL TEL MFG CO,ANTWERP,BELGIUM

来源：

MICROPROCESSORS AND MICROSYSTEMS | 1991年 / 15卷 / 02期

关键词：

TESTING; BUILT-IN SELF TEST; BOUNDARY SCAN; TEST ACCESS PORT; TEST CONTROLLER;

D O I：

10.1016/0141-9331(91)90088-W

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes the architecture and implementation of a controller for the test access port (TAP) of the standard test access port and boundary-scan architectures as defined in IEEE Std. 1149.1-1990. This controller allows any PC to be used for testing chips, boards and/or systems provided with boundary scan test facilities.

引用

页码：82 / 90

页数：9

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