OBSERVATION VIA SCANNING TUNNELING MICROSCOPY OF HEXAGONAL ETCH PITS IN GRAPHITE FLAKES

被引:3
作者
KIM, DP [1 ]
LABES, MM [1 ]
SIPERKO, LM [1 ]
机构
[1] IBM CORP, ENDICOTT, NY 13760 USA
基金
美国国家科学基金会;
关键词
GRAPHITE; BENZENE;
D O I
10.1016/0025-5408(90)90122-I
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Scanning tunneling microscopy (STM) studies of graphite flakes synthesized from a benzene precursor reveal the presence of highly symmetric hexagonal pit formation on the surface. Angles measured at the vertices of the pits are 121-degrees +/- 2-degrees. The hexagonal structures vary in size from 50-200 nm in breadth and 3-10 nm in depth. The high degree of pit symmetry is attributed to the symmetric surface and bulk structure of the flakes.
引用
收藏
页码:1461 / 1465
页数:5
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