INTERNAL STRUCTURE OF KEVLAR(R) FIBERS BY ATOMIC-FORCE MICROSCOPY

被引：40
|
作者：
LI, SFY [1 ]
MCGHIE, AJ [1 ]
TANG, SL [1 ]
机构：
[1] DUPONT CO INC,CENT RES & DEV,EXPTL STN,POB 80356,WILMINGTON,DE 19880
来源：
POLYMER | 1993年 / 34卷 / 21期
关键词：
KEVLAR(R); ATOMIC FORCE MICROSCOPY; STRUCTURE PROPERTY RELATION; PPTA FIBERS;
D O I：
10.1016/0032-3861(93)90168-A
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
The nanometre-scale resolution atomic force microscopy images of the internal structure of Kevlar(R) fibres made it possible to reconcile differences between existing proposed structural models. Detailed real-space structures of the 'pleats' in these fibres and evidence of chain-end segregation in fractured fibres revealed previously inaccessible structure-property relations.
引用
收藏
页码：4573 / 4575
页数：3
相关论文
共 50 条
  • [31] ATOMIC-FORCE MICROSCOPY STUDY OF HUMAN TOOTH ENAMEL SURFACES
    SCHAAD, P
    PARIS, E
    CUISINIER, FJG
    VOEGEL, JC
    SCANNING MICROSCOPY, 1993, 7 (04) : 1149 - 1152
  • [32] A Review of Atomic-Force Microscopy in Skin Barrier Function Assessment
    Pereda, Jorge
    Khatib, Casper Milde
    Kezic, Sanja
    Christensen, Maria Oberlander
    Yang, Sara
    Thyssen, Jacob P.
    Chu, Chia-Yu
    Riethmuller, Christoph
    Liao, Hsien-Shun
    Akhtar, Imtisal
    Ungar, Benjamin
    Guttman-Yassky, Emma
    Haedersdal, Merete
    Hwu, En-Te
    JOURNAL OF INVESTIGATIVE DERMATOLOGY, 2024, 144 (10) : 2136 - 2144
  • [33] Applications of atomic-force microscopy in environmental colloid and surface chemistry
    Maurice, PA
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1996, 107 : 57 - 75
  • [34] MESOSCOPIC ROUGHNESS CHARACTERIZATION OF GROWN SURFACES BY ATOMIC-FORCE MICROSCOPY
    YOSHINOBU, T
    IWAMOTO, A
    IWASAKI, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1994, 33 (1A): : L67 - L69
  • [35] Single-crystal diamond probes for atomic-force microscopy
    P. G. Kopylov
    B. A. Loginov
    R. R. Ismagilov
    A. N. Obraztsov
    Instruments and Experimental Techniques, 2010, 53 : 613 - 619
  • [36] COMBINED ATOMIC-FORCE AND SCANNING REFLECTION INTERFERENCE CONTRAST MICROSCOPY
    HILLNER, E
    RADMACHER, M
    HANSMA, PK
    SCANNING, 1995, 17 (03) : 144 - 147
  • [37] APPLICATION OF THE NEEDLE SENSOR FOR MICROSTRUCTURE MEASUREMENTS AND ATOMIC-FORCE MICROSCOPY
    GRUNEWALD, U
    BARTZKE, K
    ANTRACK, T
    THIN SOLID FILMS, 1995, 264 (02) : 169 - 171
  • [38] Single-crystal diamond probes for atomic-force microscopy
    Kopylov, P. G.
    Loginov, B. A.
    Ismagilov, R. R.
    Obraztsov, A. N.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2010, 53 (04) : 613 - 619
  • [39] Estimation of the transfer function of a microcantilever used in atomic-force microscopy
    Stark, M
    Guckenberger, R
    Stemmer, A
    Stark, RW
    2004 4TH IEEE CONFERENCE ON NANOTECHNOLOGY, 2004, : 155 - 157
  • [40] Evidence for atomic-scale resolution in atomic-force microscopy of layer silicates
    Wicks, FJ
    Henderson, GS
    Hawthorne, FC
    Kjoller, K
    CANADIAN MINERALOGIST, 1998, 36 : 1607 - 1614
12345