ATOMIC-FORCE MICROSCOPY OF AGBR CRYSTALS AND ADSORBED GELATIN FILMS

被引：23

作者：

HAUGSTAD, G

GLADFELTER, WL

KEYES, MP

WEBERG, EB

机构：

[1] UNIV MINNESOTA,DEPT CHEM,MINNEAPOLIS,MN 55455

[2] DUPONT CO INC,DEPT IMAGING SYST,BREVARD,NC 28712

来源：

LANGMUIR | 1993年 / 9卷 / 06期

关键词：

D O I：

10.1021/la00030a028

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Atomic force microscopy of the (111) surface of macroscopic AgBr crystals revealed steps ranging in height from two atomic layers up to 10 nm, lying predominantly along the [110] and [112] families of crystal directions. Rods of elemental Ag, formed via photoreduction, were observed along the [110] family of directions. Images of adsorbed gelatin films revealed circular pores with diameters of order 10-100 nm, extending to the AgBr surface. The length of deposition time, the pH and concentration of the gelatin solution, and the presence of steps on the AgBr surface were observed to affect the size, number, and location of pores in the gelatin films.

引用

页码：1594 / 1600

页数：7

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