OPTICAL CHARACTERIZATION OF THIN-FILMS - THEORY

被引：31

作者：

HANSEN, WN ^{[1
]}

机构：

[1] UTAH STATE UNIV,LOGAN,UT 84322

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1973年 / 63卷 / 07期

关键词：

D O I：

10.1364/JOSA.63.000793

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：793 / 802

页数：10

共 16 条

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[2]

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BARNES, JGP .

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[4]

BENNETT HE, 1967, PHYSICS THIN FILMS, V4

[5] COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS [J].

BENNETT, JM ;

BOOTY, MJ .

APPLIED OPTICS, 1966, 5 (01) :41-&

[6] ELECTRIC FIELDS PRODUCED BY PROPAGATION OF PLANE COHERENT ELECTROMAGNETIC RADIATION IN A STRATIFIED MEDIUM [J].

HANSEN, WN .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1968, 58 (03) :380-&

[7] SPECTROMETER CELLS FOR SINGLE + MULTIPLE INTERNAL REFLECTION STUDIES IN ULTRAVIOLET VISIBLE NEAR INFRARED + INFRARED SPECTRAL REGIONS [J].

HANSEN, WN ;

HORTON, JA .

ANALYTICAL CHEMISTRY, 1964, 36 (04) :783-&

[8] VARIABLE ANGLE REFLECTION ATTACHMENT FOR ULTRAVIOLET VISIBLE AND INFRARED [J].

HANSEN, WN .

ANALYTICAL CHEMISTRY, 1965, 37 (09) :1142-&

[9]

HANSEN WN, 1972, PROGR NUCL ENERGY 9, V11

[10]

HANSEN WN, 1970, S FARADAY SOCIETY

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