LATEST TRENDS IN MILLIMETER-WAVE IMAGING TECHNOLOGY

被引：87

作者：

Oka, S. ^{[1
]}

Togo, H. ^{[1
]}

Kukutsu, N. ^{[1
]}

Nagatsuma, T. ^{[1
]}

机构：

[1] NTT Microsyst Integrat Labs, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 2430198, Japan

来源：

PROGRESS IN ELECTROMAGNETICS RESEARCH LETTERS | 2008年 / 1卷

关键词：

D O I：

10.2528/PIERL07120604

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper overviews the latest trends of millimeter-wave (MMW) imaging technologies, focusing mainly on applications of and technical parameter variations for security surveillance and nondestructive inspections (NDI). We introduce a smart NDI tool using active W-band imaging, which is capable of detecting hidden surface cracks in concrete structures.

引用

页码：197 / 204

页数：8

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