COMPARISON OF SIMPLE AND NUMERICAL 2-DIMENSIONAL MODELS FOR THRESHOLD VOLTAGE OF SHORT CHANNEL MOSTS

被引：15

作者：

COE, DJ ^{[1
]}

BROCKMAN, HE ^{[1
]}

NICHOLAS, KH ^{[1
]}

机构：

[1] MULLARD RES LABS,REDHILL RH1 5HA,SURREY,ENGLAND

来源：

SOLID-STATE ELECTRONICS | 1977年 / 20卷 / 12期

关键词：

D O I：

10.1016/0038-1101(77)90209-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：993 / 998

页数：6

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