HEURISTIC ALGORITHM FOR TESTING OF ASYNCHRONOUS CIRCUITS

[1] CARTER WC, 1964, IBM J RES DEV, V8, P115

[2] HAZARD DETECTION IN COMBINATIONAL AND SEQUENTIAL SWITCHING CIRCUITS [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (02) : 90 - &

[3] FALKOFF AD, 1968, APL360 US ERS MANUAL

[4] HUFFMAN DA, 1956, J FRANKLIN I, P161

[5] HUFFMAN DA, 1956, J FRANKLIN I, P275

[6] KUBO H, 1968, NEC RES DEVELOP

[7] DIAGNOSIS OF AUTOMATA FAILURES - A CALCULUS AND A METHOD [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1966, 10 (04) : 278 - &

[8] ROTH JP, 1967, IEEE T ELECTRON COMP, VEC16, P567

[9] SESHU S, 1962, IRE T ELEC COMPUTERS, VEC11, P459

[1] CARTER WC, 1964, IBM J RES DEV, V8, P115

[2] HAZARD DETECTION IN COMBINATIONAL AND SEQUENTIAL SWITCHING CIRCUITS [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (02) : 90 - &

[3] FALKOFF AD, 1968, APL360 US ERS MANUAL

[4] HUFFMAN DA, 1956, J FRANKLIN I, P161

[5] HUFFMAN DA, 1956, J FRANKLIN I, P275

[6] KUBO H, 1968, NEC RES DEVELOP

[7] DIAGNOSIS OF AUTOMATA FAILURES - A CALCULUS AND A METHOD [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1966, 10 (04) : 278 - &

[8] ROTH JP, 1967, IEEE T ELECTRON COMP, VEC16, P567

[9] SESHU S, 1962, IRE T ELEC COMPUTERS, VEC11, P459