THE BACKGROUND TEXTURE IN X-RAY DIFFRACTION PATTERNS OF ANNEALED METALS

被引：0
|
作者：
GOSS, NP
机构：
来源：
PHYSICAL REVIEW | 1951年 / 81卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：163 / 163
页数：1
相关论文
共 50 条
  • [41] STANDARD X-RAY DIFFRACTION POWDER PATTERNS
    不详
    NATURE, 1956, 178 (4525) : 127 - 127
  • [42] RAPID RECORDING OF X-RAY DIFFRACTION PATTERNS
    不详
    METALLURGIA, 1966, 73 (438): : 195 - &
  • [43] ON THE CALCULATED X-RAY DIFFRACTION POWDER PATTERNS
    Mohanlal, S.K.
    1600, Indian Academy of Sciences (55):
  • [44] INSTRUMENT FOR MEASUREMENT OF X-RAY DIFFRACTION PATTERNS
    BENNETT, JA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (12): : 908 - 910
  • [45] X-ray diffraction characterization of thermally annealed nanometric alumina powder
    Kimmel, G.
    Dayan, D.
    Zabicky, J.
    Materials Science Forum, 2000, 321
  • [46] X-RAY DIFFRACTION DATA FOR FLUOROTITANATES OF DIVALENT METALS
    DAVIDOVICH, RL
    KAIDALOV.TA
    LEVCHISH.TF
    ZHURNAL STRUKTURNOI KHIMII, 1971, 12 (01): : 185 - +
  • [47] X-RAY DIFFRACTION PROFILES FROM DEFORMED METALS
    MITRA, GB
    BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (01): : 77 - &
  • [48] X-ray diffraction characterization of thermally annealed nanometric alumina powder
    Kimmel, G
    Dayan, D
    Zabicky, J
    EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2000, 321-3 : 762 - 767
  • [49] Profiling of Fiber Texture Gradients by Anomalous X-ray Diffraction
    Birkholz, M.
    Darowski, N.
    Zizak, I.
    ADVANCES IN SOLID STATE PHYSICS, VOL 48, 2009, 48 : 343 - +
  • [50] Quantitative texture analysis from X-ray diffraction spectra
    Wang, YD
    Zuo, L
    Liang, ZD
    Laruelle, C
    Vadon, A
    Heizmann, JJ
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1997, 30 (04) : 443 - 448
12345