A RIGOROUS DISPERSIVE CHARACTERIZATION OF MICROSTRIP CROSS AND T-JUNCTIONS

被引：62
|
作者：
WU, SC [1 ]
YANG, HY [1 ]
ALEXOPOULOS, NG [1 ]
WOLFF, I [1 ]
机构：
[1] DUISBURG UNIV,DEPT ELECT ENGN,W-4100 DUISBURG,GERMANY
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1990年 / 38卷 / 12期
关键词：
D O I：
10.1109/22.64564
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A full-wave spectral-domain analysis is applied to the characterization of multiport microstrip discontinuities. This method employs the moment method to find the currents in the microstrip circuits and subsequently the scattering parameters of the junctions. In this approach, all the physical effects are considered, including radiation and surface waves. The numerical results for a T and a cross junction are presented and agree well with the quasi-static values at low frequencies. The S parameters of a T junction are further compared with the measured results, with excellent agreement. The utilization of a shaped T junction as a broad-band equal-power divider is also discussed.
引用
收藏
页码：1837 / 1844
页数：8
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