DETERMINATION OF TRACE AMOUNTS OF OXYGEN AND SULFUR IN COPPER BY SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：3
作者：
NISHI, T
SANO, T
TAKESHITA, H
OISHI, T
ONO, K
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来源：
JOURNAL OF THE JAPAN INSTITUTE OF METALS | 1990年 / 54卷 / 06期
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D O I：
10.2320/jinstmet1952.54.6_692
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摘要：
[No abstract available]
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页码：692 / 699
页数：8
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