Ultra-Low Power Successive Approximation Analog-to-Digital Converter Using Emerging Tunnel Field Effect Transistor Technology

被引:8
|
作者
Lin, Jie [1 ]
Yuan, Jiann-Shiun [1 ]
机构
[1] Univ Cent Florida, Dept Elect & Comp Engn, Orlando, FL 32816 USA
关键词
Analog-to-Digital Converter (ADC); Successive-Approximation Register (SAR); Temperature-Stability; Tunnel FET (TFET); Ultra-Low-Power;
D O I
10.1166/jolpe.2016.1445
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper explores advantages of tunnel field effect transistor (TFET) analog-to-digital converters (ADCs) on energy efficiency and temperature stability. A fully-differential SAR ADC is designed using 20 nm TFET technology with doubled input swing and controlled comparator input common-mode voltage. Simulation results show that under V-DD of 0.1 V the ADC is able to achieve an energy of 0.1 pJ, which is one-to three-orders of magnitude lower than that of most fabricated CMOS ADCs. The temperature variation of ENOB and energy of the ADC ranging from -55 degrees C to 125 degrees C are 24% and 31.5%, respectively. Also, The SAR ADC has the maximum + 0.1/-0.2 LSB DNL and + 0.4/-0.3 LSB INL.
引用
收藏
页码:218 / 226
页数:9
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