Electronic structure and metal-insulator transition in amorphous Pd-Si alloy films

被引:14
|
作者
Tanaka, K
Furui, K
Yamada, M
机构
[1] Department of Materials Science and Engineering, Nagoya Institute of Technology, Nagoya 466, Showa-ku
关键词
Pd-Si alloys; amorphous films; X-ray diffraction; electrical resistivity; UPS and AES; core-level shifts; density of states; metal-insulator transition;
D O I
10.1143/JPSJ.64.4790
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The PdxSi100-x system forms a homogeneous amorphous phase over a wide range of composition (0 less than or equal to x less than or equal to 91, excluding regions near PdSi and Pd2Si) when the alloy is deposited on a substrate by sputtering at ambient temperature. The electrical conductivity of the amorphous alloy changes characteristically with Pd concentration from a semiconductor to a metal, the transition taking place at x(c) approximate to 12. UPS valence band spectra show that the density of states at the Fermi level is minimal for x < x(c), but emerges abruptly for x greater than or equal to x(c). AES SiL(2,3) VV spectra show that covalent Si-Si bonding is gradually reduced and replaced by metallic Pd-Si bonding as the concentration increases beyond the transition region. Relationships between the conducting properties and electronic structure of the amorphous alloys are discussed in three characteristic ranges of Pd concentration.
引用
收藏
页码:4790 / 4798
页数:9
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