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Electronic structure and metal-insulator transition in amorphous Pd-Si alloy films
被引:14
|作者:
Tanaka, K
Furui, K
Yamada, M
机构:
[1] Department of Materials Science and Engineering, Nagoya Institute of Technology, Nagoya 466, Showa-ku
关键词:
Pd-Si alloys;
amorphous films;
X-ray diffraction;
electrical resistivity;
UPS and AES;
core-level shifts;
density of states;
metal-insulator transition;
D O I:
10.1143/JPSJ.64.4790
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
The PdxSi100-x system forms a homogeneous amorphous phase over a wide range of composition (0 less than or equal to x less than or equal to 91, excluding regions near PdSi and Pd2Si) when the alloy is deposited on a substrate by sputtering at ambient temperature. The electrical conductivity of the amorphous alloy changes characteristically with Pd concentration from a semiconductor to a metal, the transition taking place at x(c) approximate to 12. UPS valence band spectra show that the density of states at the Fermi level is minimal for x < x(c), but emerges abruptly for x greater than or equal to x(c). AES SiL(2,3) VV spectra show that covalent Si-Si bonding is gradually reduced and replaced by metallic Pd-Si bonding as the concentration increases beyond the transition region. Relationships between the conducting properties and electronic structure of the amorphous alloys are discussed in three characteristic ranges of Pd concentration.
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页码:4790 / 4798
页数:9
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