DETERMINATION OF MAGNETIZATION DISTRIBUTION IN THIN FILMS USING ELECTRON MICROSCOPY

被引:305
|
作者
FULLER, HW
HALE, ME
机构
关键词
D O I
10.1063/1.1735552
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:238 / 248
页数:11
相关论文
共 50 条
  • [1] STATIC AND DYNAMIC STUDIES OF MAGNETIZATION DISTRIBUTION IN THIN FILMS BY ELECTRON MICROSCOPY
    FULLER, HW
    HALE, ME
    JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) : S308 - S309
  • [2] Direct observation of domain structure and magnetization reversal of magnetic thin films using Lorentz transmission electron microscopy
    Yu, ACC
    Petford-Long, A
    Miyazaki, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (08): : 4891 - 4896
  • [3] Direct observation of domain structure and magnetization reversal of magnetic thin films using Lorentz transmission electron microscopy
    Yu, Andrew Chak Chung
    Petford-Long, Amanda
    Miyazaki, Terunobu
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (08): : 4891 - 4896
  • [4] Electron microscopy determination of crystallographic polarity of aluminum nitride thin films
    Kuwano, Noriyuki
    Kaur, Jesbains
    Rahmah, Siti
    MICRON, 2019, 116 : 80 - 83
  • [5] Determination of the five parameter grain boundary character distribution of nanocrystalline alpha-zirconium thin films using transmission electron microscopy
    Ghamarian, I.
    Samimi, P.
    Rohrer, G. S.
    Collins, P. C.
    ACTA MATERIALIA, 2017, 130 : 164 - 176
  • [6] Magnetization and Magnetic Microscopy Studies in Fe Thin Films
    Arout Chelvane Jeyaramane
    Ch. D. V. Prasad
    Journal of Electronic Materials, 2021, 50 : 1119 - 1131
  • [7] Magnetization and Magnetic Microscopy Studies in Fe Thin Films
    Jeyaramane, Arout Chelvane
    Prasad, Ch D., V
    JOURNAL OF ELECTRONIC MATERIALS, 2021, 50 (03) : 1119 - 1131
  • [8] ELECTRON MICROSCOPY OF MULTILAYER THIN FILMS
    PEARSON, JM
    THIN SOLID FILMS, 1970, 6 (05) : 349 - &
  • [9] THIN CARBON FILMS FOR ELECTRON MICROSCOPY
    BAEV, AS
    ALEKSANDROV, AA
    KISELEV, AG
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1970, (02): : 578 - +