THERMOLUMINESCENCE STUDY OF SEMICONDUCTOR-MATERIALS SIXTE60-XAS30GE10

被引:7
作者
MAGED, AF
AMIN, YM
DURRANI, SA
机构
[1] NATL CTR RADIAT RES & TECHNOL,CAIRO,EGYPT
[2] UNIV MALAYA,DEPT PHYS,59100 KUALA LUMPUR,MALAYSIA
关键词
D O I
10.1007/BF00541618
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of gamma irradiation on SixTe60-xAs30Ge10, where x = 5, 12 and 20, has been studied using thermoluminescence (TL). As expected in semiconductor materials, both x = 5 and 20 chalcogenides showed a wide TL peak ranging from approximately 80-300-degrees-C. However, these two materials also exhibited a sharp peak at approximately 360 and approximately 380-degrees-C for x = 5 and 20, respectively. On the other hand, the material with x = 12 showed very little response to gamma radiation, but if the sample was exposed to ultraviolet light (after being glowed of any TL up to 500-degrees-C) and then glowed (called phototransfer-thermoluminescence), several peaks appeared at approximately 80, 180, 300, and 350-degrees-C. The x = 5 and 20 samples did not show any response to ultraviolet light. Because the TL response depended on the ratio of Te/Si, it can be concluded that the TL technique can also be used to characterize semiconductor materials, and it would complement other techniques such as electrical conductivity and differential thermal analysis.
引用
收藏
页码:5536 / 5538
页数:3
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