SCHOTTKY TYPE PHOTODIODES AS DETECTORS IN THE VUV AND SOFT-X-RAY RANGE

被引：94

作者：

KRUMREY, M

TEGELER, E

BARTH, J

KRISCH, M

SCHAFERS, F

WOLF, R

机构：

[1] MAX PLANCK INST SOLID STATE RES, D-7000 STUTTGART 80, FED REP GER

[2] PTB BERLIN, D-1000 BERLIN 10, FED REP GER

[3] UNIV HAMBURG, INST EXPTL PHYS 2, D-2000 HAMBURG 50, FED REP GER

来源：

APPLIED OPTICS | 1988年 / 27卷 / 20期

关键词：

D O I：

10.1364/AO.27.004336

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4336 / 4341

页数：6

共 30 条

[1] SCATTERING BY IONIZATION AND PHONON EMISSION IN SEMICONDUCTORS [J].

ALIG, RC ;

BLOOM, S ;

STRUCK, CW .

PHYSICAL REVIEW B, 1980, 22 (12) :5565-5582

[2]

BARTH J, 1986, P SOC PHOTOOPT INSTR, V733, P481

[3]

BERTOLINI G, 1968, SEMICONDUCTORS DETEC, P133

[4] SILICON PHOTODIODE DETECTOR FOR FLUORESCENCE EXAFS [J].

BOULDIN, CE ;

FORMAN, RA ;

BELL, MI .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (10) :1891-1894

[5] THE X-RAY-CALIBRATION OF SILICON P-I-N-DIODES BETWEEN 1.5 AND 17.4 KEV [J].

CORALLO, DM ;

CREEK, DM ;

MURRAY, GM .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (06) :623-626

[6]

DAY RH, 1981, LA012791360 LOS AL R

[7]

DIETZ E, 1985, 2 M SEYA NAMIOKA MON, P238

[8] DEFECT PRODUCTION IN SIO2 BY X-RAY AND CO-60 RADIATIONS [J].

DOZIER, CM ;

BROWN, DB ;

THROCKMORTON, JL ;

MA, DI .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4363-4368

[9]

Feldhaus J., 1986, P SOC PHOTO-OPT INS, V0733, P242

[10] SPECTRAL RADIANT POWER MEASUREMENTS OF VUV AND SOFT-X-RAY SOURCES USING THE ELECTRON STORAGE RING BESSY AS A RADIOMETRIC STANDARD SOURCE [J].

FISCHER, J ;

KUHNE, M ;

WENDE, B .

APPLIED OPTICS, 1984, 23 (23) :4252-4260

← 1 2 3 →