IMPROVEMENT OF CUPROUS SULFIDE STOICHIOMETRY BY ELECTROCHEMICAL AND CHEMICAL METHODS

被引：30

作者：

DACHRAOUI, M ^{[1
]}

VEDEL, J ^{[1
]}

机构：

[1] ECOLE NATL SUPER CHIM PARIS,CNRS,ELECTROCHIM ANALYT & APPL LAB,F-75005 PARIS,FRANCE

来源：

SOLAR CELLS | 1987年 / 22卷 / 03期

关键词：

D O I：

10.1016/0379-6787(87)90043-3

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

引用

页码：187 / 194

页数：8

共 11 条

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VEDEL, J .

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[6]

PALZ W, 1973, 10TH P IEEE PHOT SPE, P69

[7] INTERFACE EFFECTS IN CU2S-CDS PHOTO-VOLTAIC CELLS FORMED BY THE DRY BARRIER PROCESS [J].

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RUSSELL, GJ ;

WOODS, J .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1983, 16 (12) :2307-2316

[8]

Pfisterer F., 1975, 11th IEEE Photovoltaic Specialists Conference, P460

[9] ELECTROCHEMICAL ANALYSIS OF COPPER OXIDES PRESENT IN CUPROUS SULFIDE [J].

VEDEL, J ;

SOUBEYRAND, M .

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[10]

VEDEL J, 1982, Patent No. 11485

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